X-ray diffraction and optical characterization of interdiffusion in self-assembled InAs/GaAs quantum-dot superlattices

• Main Authors: Xu, S. J., Wang, H., Li, Q., Xie, M. H., Wang, X. C., Fan, Weijun, Feng, S. L.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/100397; http://hdl.handle.net/10220/18015
• Institution: Nanyang Technological University

We report on the characterization of thermally induced interdiffusion in InAs/GaAs quantum-dot superlattices with high-resolution x-ray diffraction and photoluminescence techniques. The dynamical theory is employed to simulate the measuredx-ray diffraction rocking curves of the InAs/GaAs quantum-dot...