Fast face detection and localization from multi-views using statistical approach

• Main Authors: Teoh, Eam Khwang, Anvar, Seyed Mohammad Hassan, Yau, Wei-Yun
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/100453; http://hdl.handle.net/10220/17901
• Institution: Nanyang Technological University

Window-based face detection methods are fast. However their results are coarse, pose dependent and require fine face alignment for face analysis. Recently a statistical approach is introduced by Toews and Arbel [1], which is able to detect faces in multiple poses and does not require face alignment....