Transverse electric dominant intersubband absorption in Si-doped GaInAsN∕GaAs quantum wells
We report observation of transverse electric TE dominant intersubband absorption in Si-doped GaInAsN/GaAs multiple-quantum-well structures. The TE dominant absorption is believed to be caused by the incorporation of nitrogen and the associated nitrogen state. When the confinement is strong in n...
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sg-ntu-dr.10356-1008052020-03-07T14:00:32Z Transverse electric dominant intersubband absorption in Si-doped GaInAsN∕GaAs quantum wells Fan, Weijun Yoon, Soon Fatt Wang, S. Z. Liu, H. C. Zhang, Dao Hua Liu, W. Sun, L. School of Electrical and Electronic Engineering Institute for Microstructural Sciences, National Research Council, Ottawa, Ontario DRNTU::Engineering::Electrical and electronic engineering We report observation of transverse electric TE dominant intersubband absorption in Si-doped GaInAsN/GaAs multiple-quantum-well structures. The TE dominant absorption is believed to be caused by the incorporation of nitrogen and the associated nitrogen state. When the confinement is strong in narrow quantum wells, the ground state is pushed up, which enhances the interaction with nitrogen state and significantly changes the nature of the state. Published version 2013-12-10T01:49:10Z 2019-12-06T20:28:37Z 2013-12-10T01:49:10Z 2019-12-06T20:28:37Z 2006 2006 Journal Article Zhang, D. H., Liu, W., Sun, L., Fan, W., Yoon, S. F., Wang, S. Z.,& Liu, H. C. (2006). Transverse electric dominant intersubband absorption in Si-doped GaInAsN∕GaAs quantum wells. Journal of applied physics, 99, 043514. 0021-8979 https://hdl.handle.net/10356/100805 http://hdl.handle.net/10220/18187 10.1063/1.2172719 en Journal of applied physics © 2006 American Institute of Physics. This paper was published in Journal of Applied Physics and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: http://dx.doi.org/10.1063/1.2172719. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. 4 p. application/pdf |
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DRNTU::Engineering::Electrical and electronic engineering Fan, Weijun Yoon, Soon Fatt Wang, S. Z. Liu, H. C. Zhang, Dao Hua Liu, W. Sun, L. Transverse electric dominant intersubband absorption in Si-doped GaInAsN∕GaAs quantum wells |
description |
We report observation of transverse electric TE dominant intersubband absorption in Si-doped
GaInAsN/GaAs multiple-quantum-well structures. The TE dominant absorption is believed to be
caused by the incorporation of nitrogen and the associated nitrogen state. When the confinement is
strong in narrow quantum wells, the ground state is pushed up, which enhances the interaction with
nitrogen state and significantly changes the nature of the state. |
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School of Electrical and Electronic Engineering |
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School of Electrical and Electronic Engineering Fan, Weijun Yoon, Soon Fatt Wang, S. Z. Liu, H. C. Zhang, Dao Hua Liu, W. Sun, L. |
format |
Article |
author |
Fan, Weijun Yoon, Soon Fatt Wang, S. Z. Liu, H. C. Zhang, Dao Hua Liu, W. Sun, L. |
author_sort |
Fan, Weijun |
title |
Transverse electric dominant intersubband absorption in Si-doped GaInAsN∕GaAs quantum wells |
title_short |
Transverse electric dominant intersubband absorption in Si-doped GaInAsN∕GaAs quantum wells |
title_full |
Transverse electric dominant intersubband absorption in Si-doped GaInAsN∕GaAs quantum wells |
title_fullStr |
Transverse electric dominant intersubband absorption in Si-doped GaInAsN∕GaAs quantum wells |
title_full_unstemmed |
Transverse electric dominant intersubband absorption in Si-doped GaInAsN∕GaAs quantum wells |
title_sort |
transverse electric dominant intersubband absorption in si-doped gainasn∕gaas quantum wells |
publishDate |
2013 |
url |
https://hdl.handle.net/10356/100805 http://hdl.handle.net/10220/18187 |
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1681046040474550272 |