A 1.2-V 1.5-Gb/s 72-Mb DDR3 SRAM

A 1.2-V 72-Mb double data rate 3 (DDR3) SRAM achieves a data rate of 1.5 Gb/s using dynamic self-resetting circuits [5]. Single-ended main data lines halve the data line...

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Main Authors: Cho, Uk Rae, Kim, Tony Tae-Hyoung, Yoon, Yong-Jin, Lee, Jong Cheol, Bae, Dae Gi, Kim, Nam Seog, Kim, Kang Young, Son, Young Jae, Yang, Jeong Suk, Sohn, Kwon Il, Kim, Sung Tae, Lee, In Yeol, Lee, Kwang Jin, Kang, Tae Gyoung, Kim, Su Chul, Ahn, Kee Sik, Byun, Hyun Geun
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2010
Subjects:
Online Access:https://hdl.handle.net/10356/100928
http://hdl.handle.net/10220/6438
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-1009282020-03-07T14:00:32Z A 1.2-V 1.5-Gb/s 72-Mb DDR3 SRAM Cho, Uk Rae Kim, Tony Tae-Hyoung Yoon, Yong-Jin Lee, Jong Cheol Bae, Dae Gi Kim, Nam Seog Kim, Kang Young Son, Young Jae Yang, Jeong Suk Sohn, Kwon Il Kim, Sung Tae Lee, In Yeol Lee, Kwang Jin Kang, Tae Gyoung Kim, Su Chul Ahn, Kee Sik Byun, Hyun Geun School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits A 1.2-V 72-Mb double data rate 3 (DDR3) SRAM achieves a data rate of 1.5 Gb/s using dynamic self-resetting circuits [5]. Single-ended main data lines halve the data line precharging power dissipation and the number of data lines. Clocks phase shifted by 0 , 90 , and 270 are generated through the proposed clock adjustment circuits. The proposed clock adjustment circuits make input data sampled with optimized setup/hold window. On-chip input termination with the linearity error of 4.1% is developed to improve signal integrity at higher data rates. A 1.2-V 1.5-Gb/s 72-Mb DDR3 SRAM is fabricated in a 0.10- m CMOS process with five metals. The cell size and the chip size are 0.845 m2 and 151.1 mm2, respectively. Published version 2010-09-08T03:55:26Z 2019-12-06T20:30:55Z 2010-09-08T03:55:26Z 2019-12-06T20:30:55Z 2003 2003 Journal Article Cho, U. R., Kim, T. H., Yoon, Y. J., Lee, J. C., Bae, D. G., Kim, N. S., et al. (2003). A 1.2-V 1.5-Gb/s 72-Mb DDR3 SRAM. IEEE Journal of Solid State Circuits, 38(11), 1943-1951. 0018-9200 https://hdl.handle.net/10356/100928 http://hdl.handle.net/10220/6438 10.1109/JSSC.2003.818137 en IEEE journal of solid state circuits © 2003 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. 9 p. application/pdf
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Cho, Uk Rae
Kim, Tony Tae-Hyoung
Yoon, Yong-Jin
Lee, Jong Cheol
Bae, Dae Gi
Kim, Nam Seog
Kim, Kang Young
Son, Young Jae
Yang, Jeong Suk
Sohn, Kwon Il
Kim, Sung Tae
Lee, In Yeol
Lee, Kwang Jin
Kang, Tae Gyoung
Kim, Su Chul
Ahn, Kee Sik
Byun, Hyun Geun
A 1.2-V 1.5-Gb/s 72-Mb DDR3 SRAM
description A 1.2-V 72-Mb double data rate 3 (DDR3) SRAM achieves a data rate of 1.5 Gb/s using dynamic self-resetting circuits [5]. Single-ended main data lines halve the data line precharging power dissipation and the number of data lines. Clocks phase shifted by 0 , 90 , and 270 are generated through the proposed clock adjustment circuits. The proposed clock adjustment circuits make input data sampled with optimized setup/hold window. On-chip input termination with the linearity error of 4.1% is developed to improve signal integrity at higher data rates. A 1.2-V 1.5-Gb/s 72-Mb DDR3 SRAM is fabricated in a 0.10- m CMOS process with five metals. The cell size and the chip size are 0.845 m2 and 151.1 mm2, respectively.
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Cho, Uk Rae
Kim, Tony Tae-Hyoung
Yoon, Yong-Jin
Lee, Jong Cheol
Bae, Dae Gi
Kim, Nam Seog
Kim, Kang Young
Son, Young Jae
Yang, Jeong Suk
Sohn, Kwon Il
Kim, Sung Tae
Lee, In Yeol
Lee, Kwang Jin
Kang, Tae Gyoung
Kim, Su Chul
Ahn, Kee Sik
Byun, Hyun Geun
format Article
author Cho, Uk Rae
Kim, Tony Tae-Hyoung
Yoon, Yong-Jin
Lee, Jong Cheol
Bae, Dae Gi
Kim, Nam Seog
Kim, Kang Young
Son, Young Jae
Yang, Jeong Suk
Sohn, Kwon Il
Kim, Sung Tae
Lee, In Yeol
Lee, Kwang Jin
Kang, Tae Gyoung
Kim, Su Chul
Ahn, Kee Sik
Byun, Hyun Geun
author_sort Cho, Uk Rae
title A 1.2-V 1.5-Gb/s 72-Mb DDR3 SRAM
title_short A 1.2-V 1.5-Gb/s 72-Mb DDR3 SRAM
title_full A 1.2-V 1.5-Gb/s 72-Mb DDR3 SRAM
title_fullStr A 1.2-V 1.5-Gb/s 72-Mb DDR3 SRAM
title_full_unstemmed A 1.2-V 1.5-Gb/s 72-Mb DDR3 SRAM
title_sort 1.2-v 1.5-gb/s 72-mb ddr3 sram
publishDate 2010
url https://hdl.handle.net/10356/100928
http://hdl.handle.net/10220/6438
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