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Digital holography for MEMS application

Studies on digital holographic microscopy for full field high resolution 3-D profiling of MEMS and micro-devices are presented. Applications for thin film thickness measurement and studies on a MEMS accelerometer are presented.

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書目詳細資料
Main Authors: Anand, Asundi, Singh, Vijay Raj
其他作者: School of Mechanical and Aerospace Engineering
格式: Conference or Workshop Item
語言:English
出版: 2011
主題:
在線閱讀:https://hdl.handle.net/10356/101298
http://hdl.handle.net/10220/7116
http://www.opticsinfobase.org/abstract.cfm?uri=DH-2009-JTuA2
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機構: Nanyang Technological University
語言: English