Digital holography for MEMS application
Studies on digital holographic microscopy for full field high resolution 3-D profiling of MEMS and micro-devices are presented. Applications for thin film thickness measurement and studies on a MEMS accelerometer are presented.
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Main Authors: | , |
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Format: | Conference or Workshop Item |
Language: | English |
Published: |
2011
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/101298 http://hdl.handle.net/10220/7116 http://www.opticsinfobase.org/abstract.cfm?uri=DH-2009-JTuA2 |
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Institution: | Nanyang Technological University |
Language: | English |
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