Digital holography for MEMS application

Studies on digital holographic microscopy for full field high resolution 3-D profiling of MEMS and micro-devices are presented. Applications for thin film thickness measurement and studies on a MEMS accelerometer are presented.

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Bibliographic Details
Main Authors: Anand, Asundi, Singh, Vijay Raj
Other Authors: School of Mechanical and Aerospace Engineering
Format: Conference or Workshop Item
Language:English
Published: 2011
Subjects:
Online Access:https://hdl.handle.net/10356/101298
http://hdl.handle.net/10220/7116
http://www.opticsinfobase.org/abstract.cfm?uri=DH-2009-JTuA2
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Institution: Nanyang Technological University
Language: English