Non-contact measurement for 3D profile of hybrid metal thin film by white-light interference system

We presented a novel optical non-contact measurement system for detection of the thickness and 3D profile of a hybrid film. The optical interference system and the corresponding compiled data processing program for realizing the non-contact detection of thickness and 3D profile of the hybrid metal f...

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Main Authors: Zhu, Shaoli, Zhou, Wei, Song, Yunfeng
Other Authors: School of Mechanical and Aerospace Engineering
Format: Article
Language:English
Published: 2013
Online Access:https://hdl.handle.net/10356/101693
http://hdl.handle.net/10220/11501
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-1016932020-03-07T13:22:21Z Non-contact measurement for 3D profile of hybrid metal thin film by white-light interference system Zhu, Shaoli Zhou, Wei Song, Yunfeng School of Mechanical and Aerospace Engineering We presented a novel optical non-contact measurement system for detection of the thickness and 3D profile of a hybrid film. The optical interference system and the corresponding compiled data processing program for realizing the non-contact detection of thickness and 3D profile of the hybrid metal film were designed. White light source was used to generate the optical interference of the hybrid Au-Ag metallic film. The characteristics of the film were analyzed through the interference fringe. The original color fringe is obtained from a CCD camera, and the Red-Green-Blue (RGB) raw fringe image is put into our compiled numerical program. The fringe phase was wrapped using Fourier transform technique. The unwrapped phase was reconstructed to be the whole-filed Z image and 3D profile by use of a bilateral filter. 2013-07-16T02:25:47Z 2019-12-06T20:42:56Z 2013-07-16T02:25:47Z 2019-12-06T20:42:56Z 2012 2012 Journal Article Zhu, S., Zhou, W., & Song, Y. (2012). Non-Contact Measurement for 3D Profile of Hybrid Metal Thin Film by White-Light Interference System. Advanced Science Letters, 18, 36-42. https://hdl.handle.net/10356/101693 http://hdl.handle.net/10220/11501 10.1166/asl.2012.4250 en Advanced science letters © 2012 American Scientific Publishers.
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
description We presented a novel optical non-contact measurement system for detection of the thickness and 3D profile of a hybrid film. The optical interference system and the corresponding compiled data processing program for realizing the non-contact detection of thickness and 3D profile of the hybrid metal film were designed. White light source was used to generate the optical interference of the hybrid Au-Ag metallic film. The characteristics of the film were analyzed through the interference fringe. The original color fringe is obtained from a CCD camera, and the Red-Green-Blue (RGB) raw fringe image is put into our compiled numerical program. The fringe phase was wrapped using Fourier transform technique. The unwrapped phase was reconstructed to be the whole-filed Z image and 3D profile by use of a bilateral filter.
author2 School of Mechanical and Aerospace Engineering
author_facet School of Mechanical and Aerospace Engineering
Zhu, Shaoli
Zhou, Wei
Song, Yunfeng
format Article
author Zhu, Shaoli
Zhou, Wei
Song, Yunfeng
spellingShingle Zhu, Shaoli
Zhou, Wei
Song, Yunfeng
Non-contact measurement for 3D profile of hybrid metal thin film by white-light interference system
author_sort Zhu, Shaoli
title Non-contact measurement for 3D profile of hybrid metal thin film by white-light interference system
title_short Non-contact measurement for 3D profile of hybrid metal thin film by white-light interference system
title_full Non-contact measurement for 3D profile of hybrid metal thin film by white-light interference system
title_fullStr Non-contact measurement for 3D profile of hybrid metal thin film by white-light interference system
title_full_unstemmed Non-contact measurement for 3D profile of hybrid metal thin film by white-light interference system
title_sort non-contact measurement for 3d profile of hybrid metal thin film by white-light interference system
publishDate 2013
url https://hdl.handle.net/10356/101693
http://hdl.handle.net/10220/11501
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