Non-contact measurement for 3D profile of hybrid metal thin film by white-light interference system
We presented a novel optical non-contact measurement system for detection of the thickness and 3D profile of a hybrid film. The optical interference system and the corresponding compiled data processing program for realizing the non-contact detection of thickness and 3D profile of the hybrid metal f...
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| Main Authors: | , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
2013
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| Online Access: | https://hdl.handle.net/10356/101693 http://hdl.handle.net/10220/11501 |
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| Institution: | Nanyang Technological University |
| Language: | English |