Measurement of transparent coating thickness by the use of white light interferometry

Measurement of transparent coating thickness by the use of white light interferometry

10.1117/12.621521

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Bibliographic Details
Main Authors: Li, M., Quan, C., Tay, C.J., Reading, I., Wang, S.
Other Authors: MECHANICAL ENGINEERING
Format: Conference or Workshop Item
Published: 2014
Subjects:
Digital filtering
FFT
Transparent coating thickness
White light interferometry
Online Access:http://scholarbank.nus.edu.sg/handle/10635/73591
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Institution: National University of Singapore

Internet

http://scholarbank.nus.edu.sg/handle/10635/73591

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