Comment on “Simulation of Schottky and Ohmic contacts on CdTe”

In the present comment, it is argued why the model assumed in [J. Appl. Phys. 109, 014509 (2011)] is inappropriate for the modeling of realistic detector grade semi-insulating CdTe devices. Amendments to the model to account for more realistic physics in devices based on semi-insulating materials ar...

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Main Authors: Dubecký, František, Dubecký, Matúš
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2014
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Online Access:https://hdl.handle.net/10356/101835
http://hdl.handle.net/10220/18786
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-1018352023-07-14T15:46:13Z Comment on “Simulation of Schottky and Ohmic contacts on CdTe” Dubecký, František Dubecký, Matúš School of Materials Science & Engineering DRNTU::Engineering::Materials::Microelectronics and semiconductor materials In the present comment, it is argued why the model assumed in [J. Appl. Phys. 109, 014509 (2011)] is inappropriate for the modeling of realistic detector grade semi-insulating CdTe devices. Amendments to the model to account for more realistic physics in devices based on semi-insulating materials are briefly pointed out. Published version 2014-02-12T03:42:30Z 2019-12-06T20:45:17Z 2014-02-12T03:42:30Z 2019-12-06T20:45:17Z 2012 2012 Journal Article Dubecký, F., & Dubecký, M. (2012). Comment on “Simulation of Schottky and Ohmic contacts on CdTe”. Journal of Applied Physics, 111(2), 026102-. 0021-8979 https://hdl.handle.net/10356/101835 http://hdl.handle.net/10220/18786 10.1063/1.3676282 en Journal of applied physics © 2012 American Institute of Physics. This paper was published in Journal Of Applied Physics and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.3676282]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
spellingShingle DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
Dubecký, František
Dubecký, Matúš
Comment on “Simulation of Schottky and Ohmic contacts on CdTe”
description In the present comment, it is argued why the model assumed in [J. Appl. Phys. 109, 014509 (2011)] is inappropriate for the modeling of realistic detector grade semi-insulating CdTe devices. Amendments to the model to account for more realistic physics in devices based on semi-insulating materials are briefly pointed out.
author2 School of Materials Science & Engineering
author_facet School of Materials Science & Engineering
Dubecký, František
Dubecký, Matúš
format Article
author Dubecký, František
Dubecký, Matúš
author_sort Dubecký, František
title Comment on “Simulation of Schottky and Ohmic contacts on CdTe”
title_short Comment on “Simulation of Schottky and Ohmic contacts on CdTe”
title_full Comment on “Simulation of Schottky and Ohmic contacts on CdTe”
title_fullStr Comment on “Simulation of Schottky and Ohmic contacts on CdTe”
title_full_unstemmed Comment on “Simulation of Schottky and Ohmic contacts on CdTe”
title_sort comment on “simulation of schottky and ohmic contacts on cdte”
publishDate 2014
url https://hdl.handle.net/10356/101835
http://hdl.handle.net/10220/18786
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