Comment on “Simulation of Schottky and Ohmic contacts on CdTe”
In the present comment, it is argued why the model assumed in [J. Appl. Phys. 109, 014509 (2011)] is inappropriate for the modeling of realistic detector grade semi-insulating CdTe devices. Amendments to the model to account for more realistic physics in devices based on semi-insulating materials ar...
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sg-ntu-dr.10356-1018352023-07-14T15:46:13Z Comment on “Simulation of Schottky and Ohmic contacts on CdTe” Dubecký, František Dubecký, Matúš School of Materials Science & Engineering DRNTU::Engineering::Materials::Microelectronics and semiconductor materials In the present comment, it is argued why the model assumed in [J. Appl. Phys. 109, 014509 (2011)] is inappropriate for the modeling of realistic detector grade semi-insulating CdTe devices. Amendments to the model to account for more realistic physics in devices based on semi-insulating materials are briefly pointed out. Published version 2014-02-12T03:42:30Z 2019-12-06T20:45:17Z 2014-02-12T03:42:30Z 2019-12-06T20:45:17Z 2012 2012 Journal Article Dubecký, F., & Dubecký, M. (2012). Comment on “Simulation of Schottky and Ohmic contacts on CdTe”. Journal of Applied Physics, 111(2), 026102-. 0021-8979 https://hdl.handle.net/10356/101835 http://hdl.handle.net/10220/18786 10.1063/1.3676282 en Journal of applied physics © 2012 American Institute of Physics. This paper was published in Journal Of Applied Physics and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following official DOI: [http://dx.doi.org/10.1063/1.3676282]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. application/pdf |
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DRNTU::Engineering::Materials::Microelectronics and semiconductor materials Dubecký, František Dubecký, Matúš Comment on “Simulation of Schottky and Ohmic contacts on CdTe” |
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In the present comment, it is argued why the model assumed in [J. Appl. Phys. 109, 014509 (2011)] is inappropriate for the modeling of realistic detector grade semi-insulating CdTe devices. Amendments to the model to account for more realistic physics in devices based on semi-insulating materials are briefly pointed out. |
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School of Materials Science & Engineering |
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School of Materials Science & Engineering Dubecký, František Dubecký, Matúš |
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Article |
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Dubecký, František Dubecký, Matúš |
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Dubecký, František |
title |
Comment on “Simulation of Schottky and Ohmic contacts on CdTe” |
title_short |
Comment on “Simulation of Schottky and Ohmic contacts on CdTe” |
title_full |
Comment on “Simulation of Schottky and Ohmic contacts on CdTe” |
title_fullStr |
Comment on “Simulation of Schottky and Ohmic contacts on CdTe” |
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Comment on “Simulation of Schottky and Ohmic contacts on CdTe” |
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comment on “simulation of schottky and ohmic contacts on cdte” |
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2014 |
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https://hdl.handle.net/10356/101835 http://hdl.handle.net/10220/18786 |
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