Dilute antimonide nitride for long wavelength infrared photodetection

InSb1−xNx materials were fabricated by direct nitrogen implantation into InSb wafer and they are characterized by X-ray diffraction, Hall measurement, X-ray photoelectron spectroscopy. In-N bonds are clearly demonstrated and other forms of nitrogen, such as antisites (NIn), interstitial N2 , also ex...

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Main Authors: Chen, X. Z., Jin, Y. J., Zhang, D. H.
其他作者: School of Electrical and Electronic Engineering
格式: Conference or Workshop Item
語言:English
出版: 2014
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在線閱讀:https://hdl.handle.net/10356/104849
http://hdl.handle.net/10220/20349
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機構: Nanyang Technological University
語言: English