Dilute antimonide nitride for long wavelength infrared photodetection
InSb1−xNx materials were fabricated by direct nitrogen implantation into InSb wafer and they are characterized by X-ray diffraction, Hall measurement, X-ray photoelectron spectroscopy. In-N bonds are clearly demonstrated and other forms of nitrogen, such as antisites (NIn), interstitial N2 , also ex...
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Main Authors: | Chen, X. Z., Jin, Y. J., Zhang, D. H. |
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Other Authors: | School of Electrical and Electronic Engineering |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2014
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/104849 http://hdl.handle.net/10220/20349 |
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Institution: | Nanyang Technological University |
Language: | English |
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