High quality InAsSb-based heterostructure n-i-p mid-wavelength infrared photodiode
We present the effect of interface quality on the performance of InAsSb based hetero n-i-p middle wavelength infrared (MWIR) photodiodes. By adopting heavily doping wide bandgap p- and n-type layers and inserting a thin layer between the two doped layers and the absorbing InAsSb region, the interfac...
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sg-ntu-dr.10356-1064132019-12-06T22:11:09Z High quality InAsSb-based heterostructure n-i-p mid-wavelength infrared photodiode Tong, Jinchao Tobing, Landobasa Y.M. Ni, Peinan Zhang, Dao Hua School of Electrical and Electronic Engineering Middle Wavelength Infrared InAsSb Based Photodiode DRNTU::Engineering::Electrical and electronic engineering We present the effect of interface quality on the performance of InAsSb based hetero n-i-p middle wavelength infrared (MWIR) photodiodes. By adopting heavily doping wide bandgap p- and n-type layers and inserting a thin layer between the two doped layers and the absorbing InAsSb region, the interface quality can be improved. We also employed proper fabrication processes in device fabrication to improve surface quality. It is found that the improved interface and surface quality can reduce the noise current and enhance detection performance. A detectivity of ~1.5×109 cmHz1/2W-1 can be achieved at room temperature, and it can be increased to ~4.0×109 cmHz1/2W-1 at 250 K. ASTAR (Agency for Sci., Tech. and Research, S’pore) MOE (Min. of Education, S’pore) EDB (Economic Devt. Board, S’pore) Accepted version 2019-03-27T06:48:00Z 2019-12-06T22:11:09Z 2019-03-27T06:48:00Z 2019-12-06T22:11:09Z 2018 Journal Article Tong, J., Tobing, L. Y. M., Ni, P., & Zhang, D. H. (2018). High quality InAsSb-based heterostructure n-i-p mid-wavelength infrared photodiode. Applied Surface Science, 427, 605-608. doi:10.1016/j.apsusc.2017.08.17 0169-4332 https://hdl.handle.net/10356/106413 http://hdl.handle.net/10220/47910 http://dx.doi.org/10.1016/j.apsusc.2017.08.177 en Applied Surface Science © 2017 Elsevier B.V. All rights reserved. This paper was published in Applied Surface Science and is made available with permission of Elsevier B.V. 14 p. application/pdf |
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Middle Wavelength Infrared InAsSb Based Photodiode DRNTU::Engineering::Electrical and electronic engineering Tong, Jinchao Tobing, Landobasa Y.M. Ni, Peinan Zhang, Dao Hua High quality InAsSb-based heterostructure n-i-p mid-wavelength infrared photodiode |
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We present the effect of interface quality on the performance of InAsSb based hetero n-i-p middle wavelength infrared (MWIR) photodiodes. By adopting heavily doping wide bandgap p- and n-type layers and inserting a thin layer between the two doped layers and the absorbing InAsSb region, the interface quality can be improved. We also employed proper fabrication processes in device fabrication to improve surface quality. It is found that the improved interface and surface quality can reduce the noise current and enhance detection performance. A detectivity of ~1.5×109 cmHz1/2W-1 can be achieved at room temperature, and it can be increased to ~4.0×109 cmHz1/2W-1 at 250 K. |
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School of Electrical and Electronic Engineering |
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School of Electrical and Electronic Engineering Tong, Jinchao Tobing, Landobasa Y.M. Ni, Peinan Zhang, Dao Hua |
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Article |
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Tong, Jinchao Tobing, Landobasa Y.M. Ni, Peinan Zhang, Dao Hua |
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Tong, Jinchao |
title |
High quality InAsSb-based heterostructure n-i-p mid-wavelength infrared photodiode |
title_short |
High quality InAsSb-based heterostructure n-i-p mid-wavelength infrared photodiode |
title_full |
High quality InAsSb-based heterostructure n-i-p mid-wavelength infrared photodiode |
title_fullStr |
High quality InAsSb-based heterostructure n-i-p mid-wavelength infrared photodiode |
title_full_unstemmed |
High quality InAsSb-based heterostructure n-i-p mid-wavelength infrared photodiode |
title_sort |
high quality inassb-based heterostructure n-i-p mid-wavelength infrared photodiode |
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2019 |
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https://hdl.handle.net/10356/106413 http://hdl.handle.net/10220/47910 http://dx.doi.org/10.1016/j.apsusc.2017.08.177 |
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