Design of ring oscillator structures for measuring isolated NBTI and PBTI

• Main Authors: Kim, Tony Tae-Hyoung, Lu, Pong-Fei., Kim, Chris H.
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Conference or Workshop Item
• 語言: English
• 出版: 2013
• 主題: DRNTU::Engineering::Electrical and electronic engineering
• 在線閱讀: https://hdl.handle.net/10356/106580; http://hdl.handle.net/10220/17772; http://dx.doi.org/10.1109/ISCAS.2012.6271555

Ring oscillator based test structures that can separately measure the NBTI and PBTI degradation effects in digital circuits are presented for high-k metal-gate devices. The proposed test structures enable simultaneous stress of all devices under test in either NBTI or PBTI mode and measure frequency...