Path oriented boolean test generation for single stuck-at fault in combinational circuits

• 主要作者: Zhang, Xudong
• 其他作者: Chin, Edward Hsi Ling
• 格式: Theses and Dissertations
• 語言: English
• 出版: 2008
• 主題: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits; DRNTU::Engineering::Computer science and engineering::Theory of computation::Analysis of algorithms and problem complexity
• 在線閱讀: http://hdl.handle.net/10356/13164
• 機構: Nanyang Technological University

To produce reliable electronic systems, defect-free components must be available. Automatic test pattern generation systems distinguish defective components from defect-free components by generating input sets that cause the outputs of a component under test to be different if the component is defec...