Path oriented boolean test generation for single stuck-at fault in combinational circuits

• المؤلف الرئيسي: Zhang, Xudong
• مؤلفون آخرون: Chin, Edward Hsi Ling
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2008
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits; DRNTU::Engineering::Computer science and engineering::Theory of computation::Analysis of algorithms and problem complexity
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/13164

To produce reliable electronic systems, defect-free components must be available. Automatic test pattern generation systems distinguish defective components from defect-free components by generating input sets that cause the outputs of a component under test to be different if the component is defec...