Path oriented boolean test generation for single stuck-at fault in combinational circuits
To produce reliable electronic systems, defect-free components must be available. Automatic test pattern generation systems distinguish defective components from defect-free components by generating input sets that cause the outputs of a component under test to be different if the component is defec...
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主要作者: | Zhang, Xudong |
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其他作者: | Chin, Edward Hsi Ling |
格式: | Theses and Dissertations |
語言: | English |
出版: |
2008
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主題: | |
在線閱讀: | http://hdl.handle.net/10356/13164 |
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機構: | Nanyang Technological University |
語言: | English |
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