InAlN/GaN HEMTs on Si With High fT of 250 GHz
In this letter, InAlN/GaN high electron mobility transistors (HEMTs) with 40-200 nm rectangular gates and 300-700 nm source-to-drain distances were fabricated on Si substrates. The device with 40-nm gate and 300-nm source-to-drain distance exhibited a high drain current of 2.66 A/mm, a transconducta...
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sg-ntu-dr.10356-1414692020-06-08T09:23:46Z InAlN/GaN HEMTs on Si With High fT of 250 GHz Xing, Weichuan Liu, Zhihong Qiu, Haodong Ranjan, Kumud Gao, Yu Ng, Geok Ing Palacios, Tomás School of Electrical and Electronic Engineering Temasek Laboratories Engineering::Electrical and electronic engineering GaN High Electron Mobility Transistor (HEMT) In this letter, InAlN/GaN high electron mobility transistors (HEMTs) with 40-200 nm rectangular gates and 300-700 nm source-to-drain distances were fabricated on Si substrates. The device with 40-nm gate and 300-nm source-to-drain distance exhibited a high drain current of 2.66 A/mm, a transconductance (gm) of 438 mS/mm, and a high current gain cutoff frequency (fT) of 250 GHz. To the best of our knowledge, this is the highest fT value reported so far for GaN-based transistors on Si. An effective electron velocity of 1.1 × 107cm/s was extracted, which is comparable with those reported for InAlN/GaN HEMTs on SiC. These excellent results indicate that GaN HEMTs on Si have a great potential for low-cost emerging mm-Wave applications. NRF (Natl Research Foundation, S’pore) 2020-06-08T09:23:45Z 2020-06-08T09:23:45Z 2017 Journal Article Xing, W., Liu, Z., Qiu, H., Ranjan, K., Gao, Y., Ng, G. I., & Palacios, T. (2018). InAlN/GaN HEMTs on Si With High fT of 250 GHz. IEEE Electron Device Letters, 39(1), 75-78. doi:10.1109/LED.2017.2773054 0741-3106 https://hdl.handle.net/10356/141469 10.1109/LED.2017.2773054 2-s2.0-85034616945 1 39 75 78 en IEEE Electron Device Letters © 2017 IEEE. All rights reserved. |
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Engineering::Electrical and electronic engineering GaN High Electron Mobility Transistor (HEMT) Xing, Weichuan Liu, Zhihong Qiu, Haodong Ranjan, Kumud Gao, Yu Ng, Geok Ing Palacios, Tomás InAlN/GaN HEMTs on Si With High fT of 250 GHz |
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In this letter, InAlN/GaN high electron mobility transistors (HEMTs) with 40-200 nm rectangular gates and 300-700 nm source-to-drain distances were fabricated on Si substrates. The device with 40-nm gate and 300-nm source-to-drain distance exhibited a high drain current of 2.66 A/mm, a transconductance (gm) of 438 mS/mm, and a high current gain cutoff frequency (fT) of 250 GHz. To the best of our knowledge, this is the highest fT value reported so far for GaN-based transistors on Si. An effective electron velocity of 1.1 × 107cm/s was extracted, which is comparable with those reported for InAlN/GaN HEMTs on SiC. These excellent results indicate that GaN HEMTs on Si have a great potential for low-cost emerging mm-Wave applications. |
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School of Electrical and Electronic Engineering |
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School of Electrical and Electronic Engineering Xing, Weichuan Liu, Zhihong Qiu, Haodong Ranjan, Kumud Gao, Yu Ng, Geok Ing Palacios, Tomás |
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Article |
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Xing, Weichuan Liu, Zhihong Qiu, Haodong Ranjan, Kumud Gao, Yu Ng, Geok Ing Palacios, Tomás |
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Xing, Weichuan |
title |
InAlN/GaN HEMTs on Si With High fT of 250 GHz |
title_short |
InAlN/GaN HEMTs on Si With High fT of 250 GHz |
title_full |
InAlN/GaN HEMTs on Si With High fT of 250 GHz |
title_fullStr |
InAlN/GaN HEMTs on Si With High fT of 250 GHz |
title_full_unstemmed |
InAlN/GaN HEMTs on Si With High fT of 250 GHz |
title_sort |
inaln/gan hemts on si with high ft of 250 ghz |
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2020 |
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https://hdl.handle.net/10356/141469 |
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1681056630709420032 |