Exploring the impact of variability in resistance distributions of RRAM on the prediction accuracy of deep learning neural networks

• Main Authors: Prabhu, Nagaraj Lakshmana, Loy, Desmond Jia Jun, Dananjaya, Putu Andhita, Lew, Wen Siang, Toh, Eng Huat, Raghavan, Nagarajan
• Other Authors: School of Physical and Mathematical Sciences
• Format: Article
• Language: English
• Published: 2021
• Subjects: Science::Physics; Convolutional Neural Network; Look-up-table
• Online Access: https://hdl.handle.net/10356/148658
• Institution: Nanyang Technological University

In this work, we explore the use of the resistive random access memory (RRAM) device as a synapse for mimicking the trained weights linking neurons in a deep learning neural network (DNN) (AlexNet). The RRAM devices were fabricated in-house and subjected to 1000 bipolar read-write cycles to measure the resistances recorded for Logic-0 and Logic-1 (we demonstrate the feasibility of achieving eight discrete resistance states in the same device depending on the RESET stop voltage). DNN simulations have been performed to compare the relative error between the output of AlexNet Layer 1 (Convolution) implemented with the standard backpropagation (BP) algorithm trained weights versus the weights that are encoded using the measured resistance distributions from RRAM. The IMAGENET dataset is used for classification purpose here. We focus only on the Layer 1 weights in the AlexNet framework with 11 × 11 × 96 filters values coded into a binary floating point and substituted with the RRAM resistance values corresponding to Logic-0 and Logic-1. The impact of variability in the resistance states of RRAM for the low and high resistance states on the accuracy of image classification is studied by formulating a look-up table (LUT) for the RRAM (from measured I-V data) and comparing the convolution computation output of AlexNet Layer 1 with the standard outputs from the BP-based pre-trained weights. This is one of the first studies dedicated to exploring the impact of RRAM device resistance variability on the prediction accuracy of a convolutional neural network (CNN) on an AlexNet platform through a framework that requires limited actual device switching test data.