On reliability analysis of smart grids under topology attacks : a stochastic Petri net approach

• المؤلفون الرئيسيون: Li, Beibei, Lu, Rongxing, Choo, Raymond Kim-Kwang, Wang, Wei, Luo, Sheng
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2021
• الموضوعات: Engineering::Electrical and electronic engineering; Cyber-physical Systems; Smart Grids
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/150294

Building an efficient, smart, and multifunctional power grid while maintaining high reliability and security is an extremely challenging task, particularly in the ever-evolving cyber threat landscape. The challenge is also compounded by the increasing complexity of power grids in both cyber and phys...