UVM testbench development for Quad-SPI controller

• المؤلف الرئيسي: Yu, Zehui
• مؤلفون آخرون: Chang Chip Hong
• التنسيق: Thesis-Master by Coursework
• اللغة: English
• منشور في: Nanyang Technological University 2022
• الموضوعات: Engineering::Electrical and electronic engineering::Integrated circuits
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/155989

With the increase in the scale and complexity of Integrated Circuits, the difficulty and workload of verification increase accordingly. Traditional verification methodologies take much time to develop testbenches and testcases. So, improving the efficiency and quality of verification has become a ho...