UVM testbench development for Quad-SPI controller

With the increase in the scale and complexity of Integrated Circuits, the difficulty and workload of verification increase accordingly. Traditional verification methodologies take much time to develop testbenches and testcases. So, improving the efficiency and quality of verification has become a ho...

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Bibliographic Details
Main Author: Yu, Zehui
Other Authors: Chang Chip Hong
Format: Thesis-Master by Coursework
Language:English
Published: Nanyang Technological University 2022
Subjects:
Online Access:https://hdl.handle.net/10356/155989
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Institution: Nanyang Technological University
Language: English