UVM testbench development for Quad-SPI controller
With the increase in the scale and complexity of Integrated Circuits, the difficulty and workload of verification increase accordingly. Traditional verification methodologies take much time to develop testbenches and testcases. So, improving the efficiency and quality of verification has become a ho...
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Main Author: | Yu, Zehui |
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Other Authors: | Chang Chip Hong |
Format: | Thesis-Master by Coursework |
Language: | English |
Published: |
Nanyang Technological University
2022
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/155989 |
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Institution: | Nanyang Technological University |
Language: | English |
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