UVM testbench development for Quad-SPI controller

With the increase in the scale and complexity of Integrated Circuits, the difficulty and workload of verification increase accordingly. Traditional verification methodologies take much time to develop testbenches and testcases. So, improving the efficiency and quality of verification has become a ho...

全面介紹

Saved in:
書目詳細資料
主要作者: Yu, Zehui
其他作者: Chang Chip Hong
格式: Thesis-Master by Coursework
語言:English
出版: Nanyang Technological University 2022
主題:
在線閱讀:https://hdl.handle.net/10356/155989
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!