Deep learning-based image analysis framework for hardware assurance of digital integrated circuits

• Main Authors: Lin, Tong, Shi, Yiqiong, Shu, Na, Cheng, Deruo, Hong, Xuenong, Song, Jingsi, Gwee, Bah Hwee
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2022
• Subjects: Engineering::Electrical and electronic engineering; Hardware Assurance; Digital ICs
• Online Access: https://hdl.handle.net/10356/159572
• Institution: Nanyang Technological University

We propose a complete Artificial Intelligence (AI)/Deep Learning (DL)-based image analysis framework for hardware assurance of digital integrated circuits (ICs). Our aim is to examine and verify various hardware information by analyzing the Scanning Electron Microscope (SEM) images of an IC. In our...