Recognizing beam profiles from silicon photonics gratings using a transformer model

Over the past decade, there has been extensive work in developing integrated silicon photonics (SiPh) gratings for the optical addressing of trapped ion qubits among the ion trap quantum computing community. However, when viewing beam profiles from gratings using infrared (IR) cameras, it is often d...

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Main Authors: Lim, Yu Dian, Li, Hong Yu, Goh, Simon Chun Kiat, Wang, Xiangyu, Zhao, Peng, Tan, Chuan Seng
其他作者: School of Electrical and Electronic Engineering
格式: Article
語言:English
出版: 2024
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在線閱讀:https://hdl.handle.net/10356/180856
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機構: Nanyang Technological University
語言: English