Testing of memory devices : a case study

• 主要作者: Fong, Siew Cheong.
• 其他作者: Ho, Duan Juat
• 格式: Theses and Dissertations
• 語言: English
• 出版: 2009
• 主題: DRNTU::Engineering::Electrical and electronic engineering::Electronic systems
• 在線閱讀: http://hdl.handle.net/10356/19611

The project examines the testing of the EPROM devices (on wafer) carried out in a local multinational company, analyses the fault coverage and proposes methods to improve the test yield. Using actual test yield data obtained from the test floor, the project examines and proposes to remove the need f...