Experimental and analytical characterization of short channel MOSFETS

Experimental and analytical characterization of short channel MOSFETS

Present the characterization of deep-sub-micrometer lightly-Doped Drain pMOSFETS operating in a Bi-MOS structure.

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Bibliographic Details
Main Author: Yeo, Kiat Seng
Other Authors: School of Electrical and Electronic Engineering
Format: Research Report
Published: 2008
Subjects:
DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Online Access:http://hdl.handle.net/10356/2722
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Institution: Nanyang Technological University

Internet

http://hdl.handle.net/10356/2722

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