Experimental and analytical characterization of short channel MOSFETS
Present the characterization of deep-sub-micrometer lightly-Doped Drain pMOSFETS operating in a Bi-MOS structure.
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2008
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Online Access: | http://hdl.handle.net/10356/2722 |
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sg-ntu-dr.10356-27222023-03-04T03:25:11Z Experimental and analytical characterization of short channel MOSFETS Yeo, Kiat Seng School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits Present the characterization of deep-sub-micrometer lightly-Doped Drain pMOSFETS operating in a Bi-MOS structure. RG 48/96 2008-09-17T09:13:48Z 2008-09-17T09:13:48Z 2000 2000 Research Report http://hdl.handle.net/10356/2722 Nanyang Technological University application/pdf |
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DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits Yeo, Kiat Seng Experimental and analytical characterization of short channel MOSFETS |
description |
Present the characterization of deep-sub-micrometer lightly-Doped Drain pMOSFETS operating in a Bi-MOS structure. |
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School of Electrical and Electronic Engineering |
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School of Electrical and Electronic Engineering Yeo, Kiat Seng |
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Research Report |
author |
Yeo, Kiat Seng |
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Yeo, Kiat Seng |
title |
Experimental and analytical characterization of short channel MOSFETS |
title_short |
Experimental and analytical characterization of short channel MOSFETS |
title_full |
Experimental and analytical characterization of short channel MOSFETS |
title_fullStr |
Experimental and analytical characterization of short channel MOSFETS |
title_full_unstemmed |
Experimental and analytical characterization of short channel MOSFETS |
title_sort |
experimental and analytical characterization of short channel mosfets |
publishDate |
2008 |
url |
http://hdl.handle.net/10356/2722 |
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1759858266085523456 |