Deposition and characterization of high-K (Ca,Sr)ZrO3 thin films using sol-gel technique

There are growing interests in high-k dielectric materials because of their broad future applications for semiconductor industry such as alternative gate oxide, high-density storage capacitors, and high-voltage capacitors.The sol-gel derived CaxSr1-xZrO3 dielectric thin films have been systematicall...

Full description

Saved in:
Bibliographic Details
Main Author: Yu, Ting
Other Authors: Zhu, Weiguang
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:https://hdl.handle.net/10356/3434
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
id sg-ntu-dr.10356-3434
record_format dspace
spelling sg-ntu-dr.10356-34342023-07-04T17:11:12Z Deposition and characterization of high-K (Ca,Sr)ZrO3 thin films using sol-gel technique Yu, Ting Zhu, Weiguang School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Electric apparatus and materials DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films There are growing interests in high-k dielectric materials because of their broad future applications for semiconductor industry such as alternative gate oxide, high-density storage capacitors, and high-voltage capacitors.The sol-gel derived CaxSr1-xZrO3 dielectric thin films have been systematically investigated for potential electronic device applications. DOCTOR OF PHILOSOPHY (EEE) 2008-09-17T09:30:07Z 2008-09-17T09:30:07Z 2005 2005 Thesis Yu, T. (2005). Deposition and characterization of high-K (Ca,Sr)ZrO3 thin films using sol-gel technique. Doctoral thesis, Nanyang Technological University, Singapore. https://hdl.handle.net/10356/3434 10.32657/10356/3434 Nanyang Technological University application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
topic DRNTU::Engineering::Electrical and electronic engineering::Electric apparatus and materials
DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Electric apparatus and materials
DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
Yu, Ting
Deposition and characterization of high-K (Ca,Sr)ZrO3 thin films using sol-gel technique
description There are growing interests in high-k dielectric materials because of their broad future applications for semiconductor industry such as alternative gate oxide, high-density storage capacitors, and high-voltage capacitors.The sol-gel derived CaxSr1-xZrO3 dielectric thin films have been systematically investigated for potential electronic device applications.
author2 Zhu, Weiguang
author_facet Zhu, Weiguang
Yu, Ting
format Theses and Dissertations
author Yu, Ting
author_sort Yu, Ting
title Deposition and characterization of high-K (Ca,Sr)ZrO3 thin films using sol-gel technique
title_short Deposition and characterization of high-K (Ca,Sr)ZrO3 thin films using sol-gel technique
title_full Deposition and characterization of high-K (Ca,Sr)ZrO3 thin films using sol-gel technique
title_fullStr Deposition and characterization of high-K (Ca,Sr)ZrO3 thin films using sol-gel technique
title_full_unstemmed Deposition and characterization of high-K (Ca,Sr)ZrO3 thin films using sol-gel technique
title_sort deposition and characterization of high-k (ca,sr)zro3 thin films using sol-gel technique
publishDate 2008
url https://hdl.handle.net/10356/3434
_version_ 1772829127739441152