Study on low temperature bonding solders for in-50 atomic % Sn/Cu joint for 3-D integrated circuit (IC)

In this project, the interaction between bi-layer eutectic In-Sn solder thin film and Cu for 3-D IC is studied. By using characterization methods such as scanning electron microscopy – energy dispersive x-ray spectroscopy (SEM-EDX) and shear test, the effects of bonding and annealing temperatures on...

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書目詳細資料
主要作者: Feng, Famin
其他作者: Gan Chee Lip
格式: Final Year Project
語言:English
出版: 2010
主題:
在線閱讀:http://hdl.handle.net/10356/38687
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