IDDQ testing for deep sub-micron SOC
The focus of this project is to study the application of new IDDQ testing schemes to deep-submicron SoC (System on Chip), for example, a 32-bit DSP microcontroller. Power partitioning has been applied to reduce the circuit scale under test from design point of view.
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2008
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| Online Access: | http://hdl.handle.net/10356/3891 |
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| Institution: | Nanyang Technological University |
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sg-ntu-dr.10356-38912023-07-04T15:01:54Z IDDQ testing for deep sub-micron SOC Ye, Xiaocheng. Lau, Wai Shing School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Electronic systems The focus of this project is to study the application of new IDDQ testing schemes to deep-submicron SoC (System on Chip), for example, a 32-bit DSP microcontroller. Power partitioning has been applied to reduce the circuit scale under test from design point of view. Master of Science (Microelectronics) 2008-09-17T09:39:49Z 2008-09-17T09:39:49Z 2005 2005 Thesis http://hdl.handle.net/10356/3891 Nanyang Technological University application/pdf |
| institution |
Nanyang Technological University |
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NTU Library |
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Asia |
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Singapore Singapore |
| content_provider |
NTU Library |
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DRNTU::Engineering::Electrical and electronic engineering::Electronic systems |
| spellingShingle |
DRNTU::Engineering::Electrical and electronic engineering::Electronic systems Ye, Xiaocheng. IDDQ testing for deep sub-micron SOC |
| description |
The focus of this project is to study the application of new IDDQ testing schemes to deep-submicron SoC (System on Chip), for example, a 32-bit DSP microcontroller. Power partitioning has been applied to reduce the circuit scale under test from design point of view. |
| author2 |
Lau, Wai Shing |
| author_facet |
Lau, Wai Shing Ye, Xiaocheng. |
| format |
Theses and Dissertations |
| author |
Ye, Xiaocheng. |
| author_sort |
Ye, Xiaocheng. |
| title |
IDDQ testing for deep sub-micron SOC |
| title_short |
IDDQ testing for deep sub-micron SOC |
| title_full |
IDDQ testing for deep sub-micron SOC |
| title_fullStr |
IDDQ testing for deep sub-micron SOC |
| title_full_unstemmed |
IDDQ testing for deep sub-micron SOC |
| title_sort |
iddq testing for deep sub-micron soc |
| publishDate |
2008 |
| url |
http://hdl.handle.net/10356/3891 |
| _version_ |
1772826654888951808 |