Application of V(z) curve technology and ultrasonic testing of flaw detection in various materials
Non Destructive Testing techniques are commonly used in many industrial applications for thickness mapping and flaw detection. This report investigates the use of conventional Ultrasonic Testing A and C scan methods (pulse echo technique)and V(z)technique to determine properties of materials with de...
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| Format: | Final Year Project |
| Language: | English |
| Published: |
2010
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| Online Access: | http://hdl.handle.net/10356/41485 |
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| Institution: | Nanyang Technological University |
| Language: | English |
| Summary: | Non Destructive Testing techniques are commonly used in many industrial applications for thickness mapping and flaw detection. This report investigates the use of conventional Ultrasonic Testing A and C scan methods (pulse echo technique)and V(z)technique to determine properties of materials with defects. |
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