Application of V(z) curve technology and ultrasonic testing of flaw detection in various materials

• Main Author: Lee, Jefferson Zhen Zhong.
• Other Authors: Wong, Brian Stephen
• Format: Final Year Project
• Language: English
• Published: 2010
• Subjects: DRNTU::Engineering::Materials::Testing of materials
• Online Access: http://hdl.handle.net/10356/41485
• Institution: Nanyang Technological University

Non Destructive Testing techniques are commonly used in many industrial applications for thickness mapping and flaw detection. This report investigates the use of conventional Ultrasonic Testing A and C scan methods (pulse echo technique)and V(z)technique to determine properties of materials with de...