Application of V(z) curve technology and ultrasonic testing of flaw detection in various materials

Application of V(z) curve technology and ultrasonic testing of flaw detection in various materials

Non Destructive Testing techniques are commonly used in many industrial applications for thickness mapping and flaw detection. This report investigates the use of conventional Ultrasonic Testing A and C scan methods (pulse echo technique)and V(z)technique to determine properties of materials with de...

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Main Author: Lee, Jefferson Zhen Zhong.
Other Authors: Wong, Brian Stephen
Format: Final Year Project
Language:English
Published: 2010
Subjects:
DRNTU::Engineering::Materials::Testing of materials
Online Access:http://hdl.handle.net/10356/41485
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Institution: Nanyang Technological University
Language: English
id sg-ntu-dr.10356-41485
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spelling sg-ntu-dr.10356-414852023-03-04T18:19:59Z Application of V(z) curve technology and ultrasonic testing of flaw detection in various materials Lee, Jefferson Zhen Zhong. Wong, Brian Stephen School of Mechanical and Aerospace Engineering DRNTU::Engineering::Materials::Testing of materials Non Destructive Testing techniques are commonly used in many industrial applications for thickness mapping and flaw detection. This report investigates the use of conventional Ultrasonic Testing A and C scan methods (pulse echo technique)and V(z)technique to determine properties of materials with defects. Bachelor of Engineering 2010-07-09T07:46:38Z 2010-07-09T07:46:38Z 2010 2010 Final Year Project (FYP) http://hdl.handle.net/10356/41485 en Nanyang Technological University 129 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Materials::Testing of materials
spellingShingle DRNTU::Engineering::Materials::Testing of materials
Lee, Jefferson Zhen Zhong.
Application of V(z) curve technology and ultrasonic testing of flaw detection in various materials
description Non Destructive Testing techniques are commonly used in many industrial applications for thickness mapping and flaw detection. This report investigates the use of conventional Ultrasonic Testing A and C scan methods (pulse echo technique)and V(z)technique to determine properties of materials with defects.
author2 Wong, Brian Stephen
author_facet Wong, Brian Stephen
Lee, Jefferson Zhen Zhong.
format Final Year Project
author Lee, Jefferson Zhen Zhong.
author_sort Lee, Jefferson Zhen Zhong.
title Application of V(z) curve technology and ultrasonic testing of flaw detection in various materials
title_short Application of V(z) curve technology and ultrasonic testing of flaw detection in various materials
title_full Application of V(z) curve technology and ultrasonic testing of flaw detection in various materials
title_fullStr Application of V(z) curve technology and ultrasonic testing of flaw detection in various materials
title_full_unstemmed Application of V(z) curve technology and ultrasonic testing of flaw detection in various materials
title_sort application of v(z) curve technology and ultrasonic testing of flaw detection in various materials
publishDate 2010
url http://hdl.handle.net/10356/41485
_version_ 1759856581928812544

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