Characterization and reliability studies of oxides grown by wet and dry oxidations for 0.25 micrometer CMOS technology

The main focus of this report is to improve the hot-carrier lifetime of a 0.25 micrometer CMOS device.

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Bibliographic Details
Main Author:	Chow, Yew Tuck.
Other Authors:	Prasad, Krishnamachar
Format:	Theses and Dissertations
Published:	2008
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Electric apparatus and materials
Online Access:	http://hdl.handle.net/10356/4166
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Institution:	Nanyang Technological University

Description
Summary:	The main focus of this report is to improve the hot-carrier lifetime of a 0.25 micrometer CMOS device.

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