Development of photolithography for the fabrication of novel GaAs based devices and diamond-like film based devices

بواسطة Prasad Krishnamachar.
منشور في 2011

Fabrication and characterization of microelectronic devices, circuits and systems IV

بواسطة Chan, Pak Kwong., Prasad, Krishnamachar.
منشور في 2008

A system health indicator for the distributed minority and majority voting based redundancy scheme

بواسطة Balasubramanian, Padmanabhan, Maskell, Douglas, Prasad, Krishnamachar
منشور في 2020

RESAC: a redundancy strategy involving approximate computing for error-tolerant applications

بواسطة Balasubramanian, Padmanabhan, Maskell, Douglas Leslie, Prasad, Krishnamachar
منشور في 2024

Development of deep submicron HEMT MMIC for millimetre-wave applications

بواسطة Ng, Geok Eng, Yuan, Xiaocong, Yoon, Soon Fatt, Radhakrishnan, K., Law, Choi Look, Ooi, Boon Siew, Prasad Krishnamachar
منشور في 2008

Fabrication and characterization of microelectronic devices, circuits and systems VI

بواسطة Radhakrishnan, K.
منشور في 2008

Improvement of contact resistance through barrier metallization optimization

بواسطة Goh, Edwin Beng Chye.
منشور في 2008

Improvement in speed performance through transistor process optimization

بواسطة Zheng, You.
منشور في 2008

Study and characterization of low dielectric constant materials for interlayer dielectric applications

بواسطة Narayanan, Babu
منشور في 2008

Source line resistance failure issues and process optimisation of self aligned source etch

بواسطة Su, Julia Hui Fong.
منشور في 2008

Influence of cleaning process on gate oxide integrity

بواسطة Liu, Qing Guang.
منشور في 2008

Significance of process exhaust system on wafer fab operation and its performance improvement

بواسطة Vedachalam Natanasabapathy
منشور في 2008

Characterization of deep trench etch recipe

بواسطة Tay, Chin Tiong.
منشور في 2008

Experimental study of copper contamination in VLSI technology

بواسطة Tey, Shih Hwee.
منشور في 2008

Process capability index (CPK) improvement for NMOS transistor IDSAT of 0.3 micrometer technology

بواسطة Goh, Beng Lee.
منشور في 2008

Characterization and reliability studies of oxides grown by wet and dry oxidations for 0.25 micrometer CMOS technology

بواسطة Chow, Yew Tuck.
منشور في 2008

Device "S" leakage failure due to plasma damage

بواسطة Tan, Siew Yoon.
منشور في 2008

Electromigration reliability of copper interconnect in submicron microelectronics application

بواسطة Ang, Kian Ann
منشور في 2008

Characteristics of chemical mechanical polishing in advanced wafer processing

بواسطة Huang, Wen Ke.
منشور في 2008

Power MOSFET yield improvement through the improvement and refinement of epitaxy process

بواسطة Ng, Kin Meng.
منشور في 2008