Effect of thermal-induced stress on SOI power devices
Silicon-on-insulator (SOI) technology presents one way of fabricating semiconductor devices on an insulating substrate rather than in a semiconductor bulk. It is a promising potential technology for the next generation ULSI because of its many advantages over its bulk silicon substrate counterpart,...
Saved in:
Main Author: | Huang, Guangyu |
---|---|
Other Authors: | Tan Cher Ming |
Format: | Theses and Dissertations |
Language: | English |
Published: |
2011
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/42905 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
Thermal modeling and characterization for power devices (IGBT)
by: Sulaiman Mohamed.
Published: (2011) -
The temperature distribution and thermal stresses induced during processing of partial SOI structures
by: Chen, Junming.
Published: (2008) -
Process and device characterisation of advanced SOI devices
by: Chan, Yeen Tat
Published: (2008) -
Design and analysis of power systems and devices
by: Choi, San Shing.
Published: (2008) -
Loss and thermal evaluation of power converters in wireless power transfer systems
by: Li, Dongxuan
Published: (2023)