Texture and stress study of barrier layers on various low-K materials in copper technology

The texture and stress properties of barrier layers on three types of low-k materials for copper (Cu) interconnects and electrical performance of the structure had been investigated.

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Bibliographic Details
Main Author: Jia, Guojun
Other Authors: Zhang, Dao Hua
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/4432
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Institution: Nanyang Technological University
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spelling sg-ntu-dr.10356-44322023-07-04T15:09:31Z Texture and stress study of barrier layers on various low-K materials in copper technology Jia, Guojun Zhang, Dao Hua School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Microelectronics The texture and stress properties of barrier layers on three types of low-k materials for copper (Cu) interconnects and electrical performance of the structure had been investigated. Master of Science (Microelectronics) 2008-09-17T09:51:22Z 2008-09-17T09:51:22Z 2004 2004 Thesis http://hdl.handle.net/10356/4432 Nanyang Technological University application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
topic DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Jia, Guojun
Texture and stress study of barrier layers on various low-K materials in copper technology
description The texture and stress properties of barrier layers on three types of low-k materials for copper (Cu) interconnects and electrical performance of the structure had been investigated.
author2 Zhang, Dao Hua
author_facet Zhang, Dao Hua
Jia, Guojun
format Theses and Dissertations
author Jia, Guojun
author_sort Jia, Guojun
title Texture and stress study of barrier layers on various low-K materials in copper technology
title_short Texture and stress study of barrier layers on various low-K materials in copper technology
title_full Texture and stress study of barrier layers on various low-K materials in copper technology
title_fullStr Texture and stress study of barrier layers on various low-K materials in copper technology
title_full_unstemmed Texture and stress study of barrier layers on various low-K materials in copper technology
title_sort texture and stress study of barrier layers on various low-k materials in copper technology
publishDate 2008
url http://hdl.handle.net/10356/4432
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