Simulating the electron beam induced current (EBIC) effect in a computer

• Main Author: Lim, Wei lun
• Other Authors: Ong Keng Sian, Vincent
• Format: Final Year Project
• Language: English
• Published: 2012
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Semiconductors
• Online Access: http://hdl.handle.net/10356/49296
• Institution: Nanyang Technological University

Electron-Beam-Induced Current (EBIC) is a technique that makes use of the induced current generated as the result of the electron beam bombardment upon the specimen for semiconductor materials and devices characterisation. Material characterisation is one of the important fields i...