Simulating the electron beam induced current (EBIC) effect in a computer
Electron-Beam-Induced Current (EBIC) is a technique that makes use of the induced current generated as the result of the electron beam bombardment upon the specimen for semiconductor materials and devices characterisation. Material characterisation is one of the important fields i...
Saved in:
| 主要作者: | |
|---|---|
| 其他作者: | |
| 格式: | Final Year Project |
| 語言: | English |
| 出版: |
2012
|
| 主題: | |
| 在線閱讀: | http://hdl.handle.net/10356/49296 |
| 標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
| 機構: | Nanyang Technological University |
| 語言: | English |