Power MOSFET yield improvement through the improvement and refinement of epitaxy process
The work involved in this project is yield improvement of Power MOSFET (PMOS) wafers manufactured in STMicroelectronics. The yield improvement was achieved through the improvement and refinement of Epitaxy process.
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sg-ntu-dr.10356-49542023-07-04T15:44:11Z Power MOSFET yield improvement through the improvement and refinement of epitaxy process Ng, Kin Meng. Prasad, Krishnamachar School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Microelectronics The work involved in this project is yield improvement of Power MOSFET (PMOS) wafers manufactured in STMicroelectronics. The yield improvement was achieved through the improvement and refinement of Epitaxy process. Master of Science (Microelectronics) 2008-09-17T10:02:08Z 2008-09-17T10:02:08Z 2003 2003 Thesis http://hdl.handle.net/10356/4954 Nanyang Technological University application/pdf |
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DRNTU::Engineering::Electrical and electronic engineering::Microelectronics Ng, Kin Meng. Power MOSFET yield improvement through the improvement and refinement of epitaxy process |
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The work involved in this project is yield improvement of Power MOSFET (PMOS) wafers manufactured in STMicroelectronics. The yield improvement was achieved through the improvement and refinement of Epitaxy process. |
author2 |
Prasad, Krishnamachar |
author_facet |
Prasad, Krishnamachar Ng, Kin Meng. |
format |
Theses and Dissertations |
author |
Ng, Kin Meng. |
author_sort |
Ng, Kin Meng. |
title |
Power MOSFET yield improvement through the improvement and refinement of epitaxy process |
title_short |
Power MOSFET yield improvement through the improvement and refinement of epitaxy process |
title_full |
Power MOSFET yield improvement through the improvement and refinement of epitaxy process |
title_fullStr |
Power MOSFET yield improvement through the improvement and refinement of epitaxy process |
title_full_unstemmed |
Power MOSFET yield improvement through the improvement and refinement of epitaxy process |
title_sort |
power mosfet yield improvement through the improvement and refinement of epitaxy process |
publishDate |
2008 |
url |
http://hdl.handle.net/10356/4954 |
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1772825404648718336 |