Power MOSFET yield improvement through the improvement and refinement of epitaxy process

The work involved in this project is yield improvement of Power MOSFET (PMOS) wafers manufactured in STMicroelectronics. The yield improvement was achieved through the improvement and refinement of Epitaxy process.

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Bibliographic Details
Main Author: Ng, Kin Meng.
Other Authors: Prasad, Krishnamachar
Format: Theses and Dissertations
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/4954
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Institution: Nanyang Technological University

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