Solder joint testing and failure analysis
Adhesively bonded joints within most electronic devices are constantly subjected to a complex combination of tensile-shear loading. These devices are also likely to undergo thermo-mechanical cycling during device processing and service and therefore, the joints are likely to have existing low-cycle...
Saved in:
Main Author: | |
---|---|
Other Authors: | |
Format: | Final Year Project |
Language: | English |
Published: |
2012
|
Subjects: | |
Online Access: | http://hdl.handle.net/10356/50170 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |