Solder joint testing and failure analysis

Adhesively bonded joints within most electronic devices are constantly subjected to a complex combination of tensile-shear loading. These devices are also likely to undergo thermo-mechanical cycling during device processing and service and therefore, the joints are likely to have existing low-cycle...

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Bibliographic Details
Main Author: Kang, Eng Tat.
Other Authors: Pang Hock Lye, John
Format: Final Year Project
Language:English
Published: 2012
Subjects:
Online Access:http://hdl.handle.net/10356/50170
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Institution: Nanyang Technological University
Language: English