Solder joint testing and failure analysis
Adhesively bonded joints within most electronic devices are constantly subjected to a complex combination of tensile-shear loading. These devices are also likely to undergo thermo-mechanical cycling during device processing and service and therefore, the joints are likely to have existing low-cycle...
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Main Author: | Kang, Eng Tat. |
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Other Authors: | Pang Hock Lye, John |
Format: | Final Year Project |
Language: | English |
Published: |
2012
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Subjects: | |
Online Access: | http://hdl.handle.net/10356/50170 |
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Institution: | Nanyang Technological University |
Language: | English |
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