Investigation of different NBTI simulation models

• Main Author: Low, Elaine Xiao Mei.
• Other Authors: Ang Diing Shenp
• Format: Final Year Project
• Language: English
• Published: 2012
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
• Online Access: http://hdl.handle.net/10356/50346
• Institution: Nanyang Technological University

Negative Bias Temperature Instability (NBTI) is an important reliability concern since integrated circuit technology has entered the ultra-scaled CMOS technology node. This phenomenon arises from traps generation at the dielectric-substrate interface under the presence of electric field and high tem...