Analysis and characterization of ultra thin SOI MOSFET by MEDICI

In this work, the charge coupling, breakdown mechanism and self-heating effect were investigated and identified by two-dimensional and two-carrier device simulation. This work provided comprehensive understanding of unique features of ultrathin SOI MOSFETs and contributed to SOI device modeling and...

全面介紹

Saved in:
書目詳細資料
主要作者: Shin, Chang Yeop.
其他作者: School of Materials Science & Engineering
格式: Theses and Dissertations
語言:English
出版: 2008
主題:
在線閱讀:http://hdl.handle.net/10356/5106
標簽: 添加標簽
沒有標簽, 成為第一個標記此記錄!
機構: Nanyang Technological University
語言: English