Analysis and characterization of ultra thin SOI MOSFET by MEDICI

In this work, the charge coupling, breakdown mechanism and self-heating effect were investigated and identified by two-dimensional and two-carrier device simulation. This work provided comprehensive understanding of unique features of ultrathin SOI MOSFETs and contributed to SOI device modeling and...

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Bibliographic Details
Main Author: Shin, Chang Yeop.
Other Authors: School of Materials Science & Engineering
Format: Theses and Dissertations
Language:English
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/5106
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Institution: Nanyang Technological University
Language: English