Evaluation of electronics materials
This study focused on the modification of Step 2 (Texturing the surface using conventional grit-blasting techniques) of the recycling process. Optical Microscopy study is employed in an attempt to understand and quantify the effect of the resulting microstructure.
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| Format: | Theses and Dissertations |
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2008
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| Online Access: | http://hdl.handle.net/10356/5749 |
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| Institution: | Nanyang Technological University |
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sg-ntu-dr.10356-57492023-03-11T17:18:18Z Evaluation of electronics materials Goh, Kok Hwee. Wong, Brian Stephen School of Mechanical and Production Engineering DRNTU::Engineering::Materials::Electronic packaging materials This study focused on the modification of Step 2 (Texturing the surface using conventional grit-blasting techniques) of the recycling process. Optical Microscopy study is employed in an attempt to understand and quantify the effect of the resulting microstructure. Master of Science (Mechanics & Processing of Materials) 2008-09-17T10:58:08Z 2008-09-17T10:58:08Z 2002 2002 Thesis http://hdl.handle.net/10356/5749 Nanyang Technological University application/pdf |
| institution |
Nanyang Technological University |
| building |
NTU Library |
| continent |
Asia |
| country |
Singapore Singapore |
| content_provider |
NTU Library |
| collection |
DR-NTU |
| topic |
DRNTU::Engineering::Materials::Electronic packaging materials |
| spellingShingle |
DRNTU::Engineering::Materials::Electronic packaging materials Goh, Kok Hwee. Evaluation of electronics materials |
| description |
This study focused on the modification of Step 2 (Texturing the surface using conventional grit-blasting techniques) of the recycling process. Optical Microscopy study is employed in an attempt to understand and quantify the effect of the resulting microstructure. |
| author2 |
Wong, Brian Stephen |
| author_facet |
Wong, Brian Stephen Goh, Kok Hwee. |
| format |
Theses and Dissertations |
| author |
Goh, Kok Hwee. |
| author_sort |
Goh, Kok Hwee. |
| title |
Evaluation of electronics materials |
| title_short |
Evaluation of electronics materials |
| title_full |
Evaluation of electronics materials |
| title_fullStr |
Evaluation of electronics materials |
| title_full_unstemmed |
Evaluation of electronics materials |
| title_sort |
evaluation of electronics materials |
| publishDate |
2008 |
| url |
http://hdl.handle.net/10356/5749 |
| _version_ |
1761781209032032256 |