Exploring & enhancing the possibilities of accelerated life testing of semiconductor components and transfer to mass production

This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor interconnects. A reliable evaluation and measurement technique is developed, based on online monitoring of electrical parameters with high measuring resolution. Local monitoring of temperature and hu...

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Bibliographic Details
Main Authors: N. B. Vignesh, Zhong, Yi, Che, Yi
Other Authors: Yue Chee Yoon
Format: Theses and Dissertations
Language:English
Published: 2014
Subjects:
Online Access:http://hdl.handle.net/10356/60715
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Institution: Nanyang Technological University
Language: English