Exploring & enhancing the possibilities of accelerated life testing of semiconductor components and transfer to mass production

• Main Authors: N. B. Vignesh, Zhong, Yi, Che, Yi
• Other Authors: Yue Chee Yoon
• Format: Theses and Dissertations
• Language: English
• Published: 2014
• Subjects: DRNTU::Engineering::Manufacturing
• Online Access: http://hdl.handle.net/10356/60715
• Institution: Nanyang Technological University

This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor interconnects. A reliable evaluation and measurement technique is developed, based on online monitoring of electrical parameters with high measuring resolution. Local monitoring of temperature and hu...